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ZEISS' new field emission scanning electron microscope (FE-SEM), the GeminiSEM 450, combines ultra-high resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use. Users benefit from high resolution, surface sensitive imaging and an optical system that ideally supports them in obtaining the best analytical results—especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to the instrument's ability to precisely and independently control spot size and beam current. With the SEM's design, it is possible to always work under optimized conditions as the user can switch seamlessly between imaging and analytical modes at the touch of a button. In addition, the unit has been designed to cater to a variety of sample types, from classical conductive metals to beam-sensitive polymers. In particular, the variable pressure technology reduces charging on non-conductive samples without compromising Inlens detection capabilities, and at the same time enables high-resolution EDS analysis by minimizing the skirt effect. Based on this design, it is a flexible instrument suited to a variety of applications in materials science, industrial labs and life sciences.
Carl Zeiss Microscopy, LLC
www.zeiss.com, 800-233-2343

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