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HORIBA Scientific has added four detectors to its CLUE Series for Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes. The series is designed for use in materials science, mineralogy, geology, life sciences and forensic applications. They interface with any SEM, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR).  SEM-CL helps discover the nature of defects, structures and stress at the nanoscale (<20 nm spatial resolution), making it the ideal tool for novel nanomaterials characterization. Designed for enhanced flexibility for multiple applications of zircons, phosphors and other minerals, to semiconductor nitrides, thin films solar cells, and 2-D materials, the SEM series offers high sensitivity for your sample of interest. The series also comes with on-site installation and training, technical support and application support to help optimize experiments.
HORIBA Scientific
www.horiba.com/scientific, 732-494-8660

 

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