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The JSM-7900F, JEOL’s new field emission SEM, is a flexible platform that combines high resolution imaging with nanoscale microanalysis. At the heart of this microscope is a new electron optical system, NeoEngine, that significantly enhances alignment accuracy, optimizes probe diameter at all conditions, and simplifies observation for all levels of operators. A powerful navigation system, Smile Navi, guides the operator through the data acquisition process. The novice can master basic SEM operation steps, and an online training guide provides comprehensive support. This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens. The SEM features an In-lens Schottky Plus field emission electron gun. Enhanced integration of the gun and low aberration condenser lens provides higher levels of brightness. Ample probe current is available at low accelerating voltage, supporting various applications from high-resolution imaging to high-speed elemental mapping. Designed to accommodate multiple analytical tools, the microscope is a virtual nanolab for a wide range of application demands.
JEOL USA, Inc.
www.jeolusa.com, 978-535-5900

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