X-Ray Analyzer Measures Coating Weights

Booth 1820. The WDXRF Portaspec X Series benchtop model X-ray analyzer from Cianflone performs multi-elemental analysis in the range of Ti to U and is suited for measuring coating weights of both chrome and titanium pretreatment, as well as zirconium pretreatment. An adjustable goniometer preset sequentially allows the user to analyze up to five elements, one at a time. Configured for analyzing liquids, powders, solids, and thin films, the X-ray spectrograph features an easy-load, two-position sample holder. Samples are changed at the open end of the holder, so a sample can be loaded while another is analyzed. A touchscreen notebook computer preinstalled with Windows-based software is also provided.
Cianflone Scientific Instruments Corp.*
228 RIDC Park West Drive
Pittsburgh PA 15275
Phone: 412-787-3600
Fax: 412-787-5022
http://www.cianflone.com

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Tim Virtualization of the Lab
With advanced computing and algorithmic technologies, modeling and simulation techniques are becoming more accepted and the results more reliable across a wide range of disciplines....continue