ED-XRF Available in Two Hardware Configurations

The XEPOS from Spectro performs energy dispersive X-ray fluorescence (ED-XRF) analysis with polarized excitation using a twelve-position precision sample plate for samples between 32 and 40 mm in diameter. Featuring a Si-drift detector, the instrument can be placed in automatic analysis mode for safe, unattended operation and offers updated software with an intuitive method wizard that guides users step-by-step through method development. In addition, it is suited for RoHS compliance for the electrical and electronics industries, examination of ores and concentrates in the chemical and petrochemical industries, and analysis of coatings. By using additional secondary targets, the detection limits for certain elements can be lowered further, making the spectrometer suitable for a number of environmental applications.
Spectro Analytical Instruments
160 Authority Drive
Fitchburg MA 01420
Phone: 978-342-3400
Fax: 978-342-8695
http://www.spectro.com

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Editor's Corner

Tim Studt, Editor-in-Chief
Tim Studt
Editor in Chief

The Rapidly Evolving Automated Lab
Implementing lab automation, robotics, and automated analyses are the easy parts. Integrating these technologies with the next technology level—artificial intelligence, autonomous operation, and android-like interfaces—will take a little more effort. But it will come...continue