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Home > Technologies > Separations/ Spectroscopy
ED-XRF Performs RoHS-ELV ScreeningThe EDX-GP energy dispersive XRF spectrometer from Shimadzu offers fast, high-sensitivity measurements optimized for RoHS/ELV hazardous element screening with easy, automatic operation for first-time users.
The instrument uses the same proprietary semiconductor detector as the EDX-720 to deliver high sensitivity, high resolution and precision measurement of all light to heavy elements. The optical system, special filters and a high-count-rate circuit deliver optimal performance for RoHS/ELV screening. The filters are automatically selected, and high-speed mode conditions are installed by default, allowing batch measurements of RoHS/ELV hazardous elements using a single filter. Users can complete a single-filter, high-speed analysis in 30 sec or high-sensitivity analysis with a special filter in 300 sec.
The spectrometer automates operations that previously relied on a user's judgment, including instrument startup, calibration, and selecting analytical conditions. The software also features a measurement time reduction function for high concentrations of hazardous elements and for samples containing no hazardous elements. This eliminates wasted measurements and achieves more efficient analysis.
Compact in size, the instrument features a large sample chamber to accommodate as-is measurements of any sample shape or size. Users can load samples quickly and easily with a semiautomatic chamber door for high throughput with less workload.
Pre-measurement instrument check determines if calibration is necessary, and automatic material evaluation pre-measures sample materials and selects analytical conditions. Shape correction eliminates the effect of shape and thickness on results, and thin-film analysis allows single- and multi-layer samples.
Shimadzu Scientific Instruments
7102 Riverwood Drive
Columbia MD 21046
Phone: 410-381-1227
Fax: 410-381-1222
http://www.ssi.shimadzu.com
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