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Micro-XRF Elemental Analyzer

The Orbis spectrometer from EDAX incorporates a motorized turret that integrates video and X-ray optics, allowing coaxial sample view and X-ray analysis. Two additional X-ray collimators can be added to the optical turret for a total of three X-ray beam sizes, expanding the instrument's capabilities beyond traditional micro-XRF analysis. Also, the increased working distance allows analysis over rough sample topography without sacrificing signal intensity.

Primary beam filters can be used with a variety of X-ray optics to allow true XRF analytical capabilities in a micro-spot analysis. The system is available with mono-capillary optics or as the Orbis PC with an ultra high-intensity poly-capillary optic. Detection limits with the Orbis PC can be <5 ppm for a spot size of 30 to 40 µm using primary beam filters. The instrument is also available with a large-area LN-free SDD for optimal signal throughput while maintaining superior elemental peak resolution.

This tabletop unit also includes easy-to-use analysis software. Users can make elemental analyses on small samples such as particles, fragments, and inclusions, or conduct automated multi-point and elemental imaging analysis on larger samples with the benefits and simplicity of an XRF analyzer.

Benefits include non-destructive measurement, minimal sample preparation (i.e. no sample coating is necessary), improved sensitivity for many elements in comparison to SEM/EDS, inclusion and coating thickness analysis with the penetrating power of X-rays, and analysis of wet samples.

Applications include forensics, quality control, non-destructive materials testing, RoHS compliance, layer thickness and composition analysis, and geologic composition.
EDAX Inc.
91 McKee Drive
Mahwah NJ 07430
Phone: 201-529-4880
Fax: 201-529-3156
www.edax.com

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