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Home > Technologies > Separations/ Spectroscopy
FTIR System Suited for Academic Research  The Exoscan FTIR system from A2 Technologies is the first FTIR that can be used as a full-performance laboratory benchtop system and/or as a hand-held battery-powered system. Exoscan provides professors a FTIR system that is equally effectively in the lab or the field, for research and/or instruction purposes.
The FTIR system’s compact size minimizes footprint on highly valuable bench space and is optimized for robustness—critical for multi-user environments. No user alignment or external utilities other than power is required. A light weight allows the system to be moved from lab to lab with ease.
The Exoscan is available with an optional docking station that enables operation as a classical bench top system and transforms in seconds into a battery-powered, field-ready teaching system. The FTIR system has a range of user interchangeable sampling interfaces (ATR, external, grazing angle and diffuse reflectance) that enable students to experience the range of applications on solid and liquid samples.
Exoscan’s ATR interface is suited for the analysis of solids and liquids. The sampling interface is comprised of a diamond internal reflection crystal, which makes it impervious to corrosion and scratching. The specular reflectance interface, with its 45 degree angle of incidence, is excellent for the measurement of compounds on the surface of reflective metals. One particularly useful application of the reflectance technique is analyzing the thickness and uniformity of coatings on metal surfaces. The grazing angle reflectance interface is similar in concept to the specular reflectance interface, but has a nominal angle of 82 degrees. The high throughput optic system yields over 80% throughput, producing signal-to noise-even on short measurements. In addition to the increased path length, grazing angle reflectance shows additional sensitivity due to enhancement of the electric field of the p-polarized light at the surface. The diffuse reflectance sampling interface is designed to bring the infrared energy to the sample at a near normal incidence and the scattered light is collected around the outside of the illumination cone. The diffuse reflectance interface is a versatile and easy-to-use sampling technology for a hand-held FTIR. The large depth of field enables diffuse reflectance to yield good spectra without touching the sample and is less sensitive to alignment with the surface.
A simple user interface and software architecture allows users with various skill levels to operate the system effectively via a PDA, laptop or desktop computer. A large beam aperture coupled with ultrashort internal beam path means that the Exoscan performs at a level equivalent or better than traditional benchtop FTIR spectrometers.
Spectral data can be gathered in the field and brought to the lab for analysis and evaluation. The ability to analyze samples in real time in the field also allows researchers to reduce or eliminate the number of less important samples brought back to the lab and to identify and concentrate on sections of the working field where more critical samples are found. A docking station, available for converting the system to bench top capability, allows a desktop computer to be used with Exoscan for advanced data analysis.
Exoscan data files rapidly transfer to commercial data analysis packages such as Grams and Panorama Pro for advanced data analysis application and the user interface is suited for use in the field and features the ability to quickly measure and store data. Currently, Exoscan systems are in use by academic researchers in geosciences, art and historical object conservation, and engineering applications.
A2 Technologies LLC
14 Commerce Drive
Danbury CT 06810
Phone: 203-312-1100
Fax: 203-312-1058
http://www.a2technologies.com
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