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Analyzer Features Two Particle Characterization Techniques

Wed, 02/06/2013 - 1:27pm

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Cilas Particle Size’s Nano DS Dual Light Scattering Particle Size Analyzer features a technology that takes nanoparticle characterization to the next level. By combining dynamic light scattering and static light scattering measurement in a single optical system, the system is more effective at analyzing nanoparticles. The analyzer is the only nanoparticle size analyzer that allows the user to select different measurement angles.Cilas Particle Size’s Nano DS Dual Light Scattering Particle Size Analyzer features a technology that takes nanoparticle characterization to the next level. By combining dynamic light scattering and static light scattering measurement in a single optical system, the system is more effective at analyzing nanoparticles. The analyzer is the only nanoparticle size analyzer that allows the user to select different measurement angles. This technology provides enhanced accuracy and repeatability across the entire 0.3 nm to 10 µm size range. Combining these two particle characterization techniques ensures results are accurate, even if the sample is agglomerated or has a multi-modal size distribution. The unit features a solid state laser diode technology that offers a longer life, short warm up and enhanced thermal stability. This compact, portable, easy-to-use instrument is a suited solution for nanoparticle characterization. 

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