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Electron Microscope Minimizes Distortion

Electron Microscope Minimizes DistortionBooth 1642. Magellan high-resolution scanning electron microscope (XHR SEM) enables viewing of 3-D surface images at many different angles and at resolutions below one nanometer. It images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating the material below. Other features include electron gun technology, a five-axis piezo-ceramic stage and high-stability platform with fully configurable analytical chamber. In addition, the stage readily accommodates large samples or multiple smaller samples while providing fast and accurate navigation and stability. ,
FEI Company
5350 NE Dawson Creek Dive.
Hillsboro OR 97124
Phone: 503-726-7500
Fax: 503-726-7509
http://www.FEI.com

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michelle
Michelle Longo
Asst. Managing Editor

Striving Toward Secondary Goals
Late last month, Republican presidential candidate Newt Gingrich stunned most everyone when he declared his promise that "by the end of my second term, we will have the first permanent base on the moon." While I don’t fault Gingrich for dreaming and trying to set high standards and goals, I can’t help but think of the enormous amount of known and unknown variables that significantly deter this accomplishment...continue

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