S-TEM Sets Resolution Benchmark

The JEM-ARM200F atomic resolution analytical microscope features advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class. The instrument has a guaranteed HAADF-STEM (high angle annular dark field) resolution of 80 pm, or 0.08 nm. With advanced analytical capabilities, the device enables both atom-by-atom imaging resolution and superior spatial resolution for atom-to-atom chemical mapping of materials, including energy-dispersive X-ray spectroscopy and electron energy-loss spectroscopy. The electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The electron column is isolated from the environmental disturbances found in most labs.
JEOL Inc.
11 Dearborn Rd.
Peabody MA 01960
Phone: 978-535-5900
Fax: 978-536-2205
http://www.jeol.com

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Editor's Corner

Tim Virtualization of the Lab
With advanced computing and algorithmic technologies, modeling and simulation techniques are becoming more accepted and the results more reliable across a wide range of disciplines....continue