S-TEM Sets Resolution Benchmark

The JEM-ARM200F atomic resolution analytical microscope features advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class. The instrument has a guaranteed HAADF-STEM (high angle annular dark field) resolution of 80 pm, or 0.08 nm. With advanced analytical capabilities, the device enables both atom-by-atom imaging resolution and superior spatial resolution for atom-to-atom chemical mapping of materials, including energy-dispersive X-ray spectroscopy and electron energy-loss spectroscopy. The electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The electron column is isolated from the environmental disturbances found in most labs.
JEOL Inc.
11 Dearborn Rd.
Peabody MA 01960
Phone: 978-535-5900
Fax: 978-536-2205
http://www.jeol.com

Company’s Other Products

Products

News
Hawaii Home for World's Largest Telescope
The Oil Shale Scream
Largest Optical Telescope Unveiled
Visual Cortex Predicts What It Will See

Type Your Comment...

Name:
E-mail (optional):	*E-mail addresses do not publish to the site.
Comment:

Editor's Corner

Tim Studt, Editor-in-Chief
Tim Studt
Editor in Chief

Statistical Sampling Could Protect Food Safety
The current recall of hundreds of millions of eggs based on a couple of hundred cases of salmonella poisoning (none fatal) reflects on the statistical sampling methods in place to protect the public’s safety.. ...continue