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Atomic Force Microscope Features Resolving Power 
Bruker Nano's N8 NEOS, the first atomic force microscope (AFM) that operates like a classical optical microscope, yet with stability and precision that enables atomic resolution.
As today’s most advanced optically navigated AFM, the N8 NEOS offers the familiar handling of most research optical microscopes. The sample investigation starts with optical inspection at lower and then higher magnifications to determine the regions of interest. Finally, for highest, atomic resolution Bruker’s compact, interferometry-based AFM module NANOS is used. Arranged at the objective turret just like the various optical objectives, the NANOS can be positioned to the localized spot within >1 µm by a turn of the turret. The N8 NEOS provides for seamless integration of AFM into the micro- and nanoscopic inspection process.
Compared to its predecessor, fundamental parts of the N8 NEOS AFM system have been redesigned. A rigid granite stand is incorporated for lowest thermal drift and highest stability. The ultra-precision vertical stage is a proprietary development and enables a fast and safe auto-approach. Like all Bruker AFMs, the N8 NEOS uses fiber-optic interferometry as the basic principle for the detection of cantilever deflection, providing superior sensitivity combined with a truly calibrated measurement of the cantilever’s deflection and amplitude, respectively.
Bruker Optics*
19 Fortune Drive
Billerica MA 01821
Phone: 978-439-9899
http://www.bruker.com
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