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SEMs Provide Faster Gunshot Residue Analysis Suited for analyzing gunshot residues (GSR), the GSR S50 and GSR F50 SEMs from FEI Co. include the Magnum GSR software and specially-modified hardware to provide fully-automated analysis with dramatic improvements in speed, accuracy and affordability.
The S50 and F50 completely automate the analysis procedure reducing opportunity for operator error. The systems include dedicated validation routines for accurate results. In addition, optimal use of the SEM’s imaging capabilities and features, such as the beam current booster, give faster, more repeatable results.
GSR analysis uses high-resolution SEM imaging to locate residue particles, and X-ray spectrometry to determine their elemental composition. The GSR S50’s ability to image uncoated samples in low vacuum mode helps preserve sample integrity. The GSR F50’s field emission source delivers higher spatial resolution and puts more beam current into a smaller spot for faster, more precise X-ray analysis.
The Magnum GSR software, included in both systems, uses the SEM’s native imaging capabilities to locate particles, which is faster than the conventional approach that uses the X-ray system to control the particle imaging and detection process. A specially-designed beam current booster (BCB) increases beam current during X-ray data acquisition to improve the speed and precision of the analysis.
To help optimize price/performance, both systems are fully compatible with the latest high count rate silicon drift X-ray detectors from Bruker Corporation and EDAX. They also include built-in validation procedures that use the latest standard layouts of the ENFSI proficiency tests.
FEI Company
5350 NE Dawson Creek Dr.
Hillsboro OR 97124
Phone: 503-726-7500
Fax: 503-726-7509
http://www.feicompany.com
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