 Microscope Features AFM and STM in One Unit
Built for university labs and routine industrial applications, NT-MDT’s Solver Next scanning probe microscope features both atomic force microscopy (AFM) and scanning tunneling microscopy (STM) in one unit. The microscope provides more than 40 different measurement modes without the need for advanced training to run most scanning probe instruments. The full system, including sample loading, can be run remotely, making it suited for telemicroscopy and hazardous environments such as nuclear facilities.
The system runs Windows using the MAC hardware and operating system. An iPhone applet allows users to share or E-mail images, including 3-D presentations, onsite. The applet includes simple measurements such as length, depth and average surface roughness.
With the microscope, a sample can be placed on the scanning stage located between the two heads, and with the click of a mouse, the head of choice automatically moves into position; the cantilever, laser and photodiode are automatically aligned; and the image is acquired. A second mouse click can switch one measurement head to the other. An additional docking port supports a third microscope head, either for nanoindentation or measurement in liquid.
NT-MDT
2255 Martin Avenue Suite H
Santa Clara, CA 95050
Phone: 408-988-8409
www.NT-MDT.com
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