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Home > Technologies > Separations/ Spectroscopy
XRF Automatically Selects Optimal Filters The EDX-GP from Shimadzu Scientific Instruments offers fast, high-sensitivity measurements optimized for RoHS/ELV hazardous element screening. The system uses a proprietary semiconductor detector to deliver high sensitivity, high resolution and precision measurement of all light to heavy elements. Optimal filters are automatically selected, and high-speed mode conditions are installed by default to allow batch measurements of RoHS/ELV hazardous elements using a single filter. Users can complete a single-filter, high-speed analysis in 30 sec or a high-sensitivity analysis with a special filter in 300 sec. Automated operations include instrument startup and calibration and the selection of analytical conditions. The software also features a measurement time reduction function for samples containing hazardous elements and no hazardous elements. The large sample chamber accommodates as-is measurements, and the semiautomatic chamber door facilitates high throughput. Other features include pre-measurement instrument checks, automatic material evaluation and select analytical conditions, shape correction, and thin-film analysis for single- and multi-layer samples.
Shimadzu Scientific Instruments
7102 Riverwood Drive
Columbia MD 21046
Phone: 410-381-1227
Fax: 410-381-1222
http://www.ssi.shimadzu.com
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