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Spectrometry And Spectroscopy

High-accuracy, Open-frame Scanner

December 10, 2014 9:50 am | Aerotech, Inc. | Product Releases | Comments

The highly repeatable and thermally stable feedback sensors used on the AGV-HPO scanner systems can be calibrated down to single-digit, micron-level accuracy over the field of view. With the low thermal gain drift performance of the position transducers, complex, high-density laser machining applications will maintain consistent micron-level feature placement accuracy over the lifetime of the process.

LISTED UNDER: Rapid Scanning

Spectrophtometer is Accurate Across Entire Wavelength Range

December 10, 2014 9:39 am | Shimadzu Scientific Instruments | Product Releases | Comments

Shimadzu Scientific’s UV-3600 Plus UV-Vis/NIR spectrophotometer is equipped with three detectors—PMT (photomultiplier tube) for ultraviolet and visible regions, and InGaAs and cooled PbS for the near-infrared region—to ensure high sensitivity across the entire measured wavelength range.

LISTED UNDER: Spectrophotometers

Spectophotometers Feature Unique Optical Design

December 10, 2014 9:34 am | Product Releases | Comments

JASCO’s V-700 Series of UV-Vis/NIR spectrophotometers features a rugged and compact design, enhanced optical performance, high-speed scanning, and a range of application-specific accessories and software. The series boasts five distinct models, including the V-780 with a unique optical design incorporating a dual-grating, dual-detector system with an InGaAs NIR detector to fully cover the wavelength range from 190 to 1600 nm with enhanced sensitivity in the NIR region.

LISTED UNDER: Spectrophotometers
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Integrating Spheres for FTIR Provide Enhanced Sensitivity

November 7, 2014 3:12 pm | PIKE Technologies | Product Releases | Comments

PIKE Technologies’ IntegratIR integrating spheres are designed for use with a wide range of FTIR spectrometers that support an external detector option. The spheres feature 3”-diameter highly reflective gold-coated surfaces and are available in upward- and downward-looking configurations.

LISTED UNDER: Spectrometry And Spectroscopy

Lightweight Spectrometer Boasts Easy Auto Features

November 7, 2014 3:10 pm | Product Releases | Comments

Covering the UV-VIS/NIR range from 650 to 1050 nm, SPECTRAL EVOLUTION’s LF-880 offers powerful spectrometer capabilities in a compact and reliable package. It is designed for fast and easy integration into OEM products or use as a lab instrument for measurement applications in remote sensing, mineral identification and general photonics.

LISTED UNDER: Spectrometers

Gold Nanoparticle Substrates Amplify Raman Signals

November 7, 2014 3:03 pm | Ocean Optics | Product Releases | Comments

Ocean Optics’ Surface Enhanced Raman Spectroscopy (SERS) substrates are highly sensitive, stable and reliable, delivering precise trace-level Raman spectroscopy measurement in applications ranging from chemical and explosive agent detection to authentication, contaminant screening and quality control in production environments and the laboratory. Using precisely controlled gold nanoparticles, the substrates amplify weak Raman signals by many orders of magnitude.

LISTED UNDER: Raman

ICP/OES System Can Handle Challenging Samples

November 7, 2014 11:48 am | Agilent Technologies, Inc. | Product Releases | Comments

Agilent Technologies’ 5100 Inductively Coupled Plasma Optical Emission Spectrometer (ICP/OES) enables customers to run samples faster, using less gas and without compromising performance on even the toughest samples. The instrument is ideal for labs doing food, environmental and pharmaceuticals testing, as well as mining and industrial applications.

LISTED UNDER: Spectrometers

Atomic Emission Spectrometers Reduce Analysis Cost

November 7, 2014 11:44 am | Shimadzu Scientific Instruments | Product Releases | Comments

Shimadzu Scientific Instruments’ ICPE-9800 Series simultaneous ICP atomic emission spectrometers represents advanced spectrometry for chemical, environmental, pharmaceutical, food, metal and electronics analysis. The series includes the ICPE-9810 (Axial) and ICPE-9820 spectrometers (Dual View).

LISTED UNDER: Spectrophotometers
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inVia confocal Raman microscope

November 6, 2014 11:34 am | Renishaw, Inc. | Products

inVia is the ultimate research-grade confocal Raman microscope designed for users to concentrate on the science, not adjusting the instrument. It is simple to operate yet delivers outstanding performance and reliable results, for even the most challenging experiments. With inVia you have flexibility and capability, without complexity. A robust design and precision automated assemblies enable inVia to complete common tasks—such as switching laser wavelength, changing diffraction grating, and acquiring a Raman image—rapidly, simply, reliably, and without the need for manual intervention. With unparalleled flexibility, scientists and engineers, worldwide, trust inVia.

LISTED UNDER: Raman | Raman

Octane Silicon Drift Detector (SDD) Series for the TEM

October 21, 2014 11:05 am | EDAX, Inc. | Products

EDAX’s Octane SDD Series for the TEM are the world's first SDDs for the TEM that are fully integrated. Data acquisition and signal processing electronics are fully integrated into the detector. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer.

LISTED UNDER: Elemental | TEM (Transmission Electron Microscope) | X-ray Equipment, Spectrometers

TEAM™ Neptune Analysis System (EDS-WDS)

October 21, 2014 10:56 am | EDAX, Inc. | Products

TEAM™ Neptune offers the seamless combination of the analysis features of EDS and the complementary enhanced qualitative and quantitative analysis capacity of WDS in a single easy to use interface for advanced materials characterization results.

LISTED UNDER: Elemental | X-ray Equipment, Spectrometers | Electron Energy Dispersive

TEAM™ Trident Analysis System (EDS-EBSD-WDS)

October 21, 2014 10:48 am | EDAX, Inc. | Products

TEAM™ Trident combines the latest advances in EDS, EBSD and WDS in a single analytical tool. With the Smart Features included in the easy to use TEAM™ analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, which results in comprehensive data collection, which can then be shared between the different techniques.

LISTED UNDER: Elemental | Diffraction, X-ray | Electron Energy Dispersive

TEAM™ Pegasus Analysis System (EDS-EBSD)

October 21, 2014 10:43 am | EDAX, Inc. | Products

To completely understand a material, whether it be naturally occurring or man-made, the scientist needs to determine the relationships between its physical properties, morphology, chemistry and crystallography. TEAM™ Pegasus enables the simultaneous collection of EDS (chemistry) and EBSD (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.

LISTED UNDER: Elemental | Diffraction, X-ray | Electron Energy Dispersive

DigiView EBSD Camera

October 21, 2014 10:40 am | EDAX, Inc. | Products

EDAX's DigiView is a versatile high resolution digital camera for capturing high quality EBSD patterns with a maximum acquisition speed of 200 indexing points per second with 99% indexing reliability. The CCD sensor has a high Quantum Efficiency (QE) and the camera is designed for very low noise imaging, and when combined with an optimized phosphor screen, results in a higher sensitivity for EBSD applications.

LISTED UNDER: Elemental | Diffraction, X-ray | Electron

Transition Element X-ray Spectrometer (TEXS) - High Precision (HP)

October 21, 2014 10:38 am | EDAX, Inc. | Products

The transition X-ray spectrometer (TEXS) is a WDS spectrometer, which features X-ray optics designed for parallel beam operation. The TEXS is optimized to cover low energy and transition element energies from 150 eV up to 10 keV.

LISTED UNDER: Inorganic | Organic

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