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Spectrometry And Spectroscopy

Integrating Spheres for FTIR Provide Enhanced Sensitivity

November 7, 2014 3:12 pm | PIKE Technologies | Product Releases | Comments

PIKE Technologies’ IntegratIR integrating spheres are designed for use with a wide range of FTIR spectrometers that support an external detector option. The spheres feature 3”-diameter highly reflective gold-coated surfaces and are available in upward- and downward-looking configurations.

LISTED UNDER: Spectrometry And Spectroscopy

Lightweight Spectrometer Boasts Easy Auto Features

November 7, 2014 3:10 pm | Product Releases | Comments

Covering the UV-VIS/NIR range from 650 to 1050 nm, SPECTRAL EVOLUTION’s LF-880 offers powerful spectrometer capabilities in a compact and reliable package. It is designed for fast and easy integration into OEM products or use as a lab instrument for measurement applications in remote sensing, mineral identification and general photonics.

LISTED UNDER: Spectrometers

Gold Nanoparticle Substrates Amplify Raman Signals

November 7, 2014 3:03 pm | Ocean Optics | Product Releases | Comments

Ocean Optics’ Surface Enhanced Raman Spectroscopy (SERS) substrates are highly sensitive, stable and reliable, delivering precise trace-level Raman spectroscopy measurement in applications ranging from chemical and explosive agent detection to authentication, contaminant screening and quality control in production environments and the laboratory. Using precisely controlled gold nanoparticles, the substrates amplify weak Raman signals by many orders of magnitude.

LISTED UNDER: Raman
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ICP/OES System Can Handle Challenging Samples

November 7, 2014 11:48 am | Agilent Technologies, Inc. | Product Releases | Comments

Agilent Technologies’ 5100 Inductively Coupled Plasma Optical Emission Spectrometer (ICP/OES) enables customers to run samples faster, using less gas and without compromising performance on even the toughest samples. The instrument is ideal for labs doing food, environmental and pharmaceuticals testing, as well as mining and industrial applications.

LISTED UNDER: Spectrometers

Atomic Emission Spectrometers Reduce Analysis Cost

November 7, 2014 11:44 am | Shimadzu Scientific Instruments | Product Releases | Comments

Shimadzu Scientific Instruments’ ICPE-9800 Series simultaneous ICP atomic emission spectrometers represents advanced spectrometry for chemical, environmental, pharmaceutical, food, metal and electronics analysis. The series includes the ICPE-9810 (Axial) and ICPE-9820 spectrometers (Dual View).

LISTED UNDER: Spectrophotometers

inVia confocal Raman microscope

November 6, 2014 11:34 am | Renishaw, Inc. | Products

inVia is the ultimate research-grade confocal Raman microscope designed for users to concentrate on the science, not adjusting the instrument. It is simple to operate yet delivers outstanding performance and reliable results, for even the most challenging experiments. With inVia you have flexibility and capability, without complexity. A robust design and precision automated assemblies enable inVia to complete common tasks—such as switching laser wavelength, changing diffraction grating, and acquiring a Raman image—rapidly, simply, reliably, and without the need for manual intervention. With unparalleled flexibility, scientists and engineers, worldwide, trust inVia.

LISTED UNDER: Raman | Raman

Octane Silicon Drift Detector (SDD) Series for the TEM

October 21, 2014 11:05 am | EDAX, Inc. | Products

EDAX’s Octane SDD Series for the TEM are the world's first SDDs for the TEM that are fully integrated. Data acquisition and signal processing electronics are fully integrated into the detector. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer.

LISTED UNDER: Elemental Analyzer | TEM (Transmission Electron Microscope) | X-ray Equipment, Spectrometers

TEAM™ Neptune Analysis System (EDS-WDS)

October 21, 2014 10:56 am | EDAX, Inc. | Products

TEAM™ Neptune offers the seamless combination of the analysis features of EDS and the complementary enhanced qualitative and quantitative analysis capacity of WDS in a single easy to use interface for advanced materials characterization results.

LISTED UNDER: Elemental Analyzer | X-ray Equipment, Spectrometers | Electron Energy Dispersive
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TEAM™ Trident Analysis System (EDS-EBSD-WDS)

October 21, 2014 10:48 am | EDAX, Inc. | Products

TEAM™ Trident combines the latest advances in EDS, EBSD and WDS in a single analytical tool. With the Smart Features included in the easy to use TEAM™ analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, which results in comprehensive data collection, which can then be shared between the different techniques.

LISTED UNDER: Elemental Analyzer | Diffraction, X-ray | Electron Energy Dispersive

TEAM™ Pegasus Analysis System (EDS-EBSD)

October 21, 2014 10:43 am | EDAX, Inc. | Products

To completely understand a material, whether it be naturally occurring or man-made, the scientist needs to determine the relationships between its physical properties, morphology, chemistry and crystallography. TEAM™ Pegasus enables the simultaneous collection of EDS (chemistry) and EBSD (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.

LISTED UNDER: Elemental Analyzer | Diffraction, X-ray | Electron Energy Dispersive

DigiView EBSD Camera

October 21, 2014 10:40 am | EDAX, Inc. | Products

EDAX's DigiView is a versatile high resolution digital camera for capturing high quality EBSD patterns with a maximum acquisition speed of 200 indexing points per second with 99% indexing reliability. The CCD sensor has a high Quantum Efficiency (QE) and the camera is designed for very low noise imaging, and when combined with an optimized phosphor screen, results in a higher sensitivity for EBSD applications.

LISTED UNDER: Elemental Analyzer | Diffraction, X-ray | Electron

Transition Element X-ray Spectrometer (TEXS) - High Precision (HP)

October 21, 2014 10:38 am | EDAX, Inc. | Products

The transition X-ray spectrometer (TEXS) is a WDS spectrometer, which features X-ray optics designed for parallel beam operation. The TEXS is optimized to cover low energy and transition element energies from 150 eV up to 10 keV.

LISTED UNDER: Inorganic | Organic | Organometallic

Low Energy X-ray Spectrometer (LEXS)

October 21, 2014 10:37 am | EDAX, Inc. | Products

The low energy X-ray spectrometer (LEXS) is a WDS spectrometer, which features X-ray optics designed for parallel beam operation. The LEXS is optimized to cover low energy applications - ideal for excitation voltages of up to 5 keV.

LISTED UNDER: Inorganic | Organic | Organometallic

Orbis Micro-XRF Elemental Analyzer

October 21, 2014 10:32 am | EDAX, Inc. | Products

Now you can get advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample types and shapes. There is minimal sample preparation. No coating is required. Orbis Micro Energy Dispersive Analyzers (Micro-EDXRF) incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.

LISTED UNDER: Inorganic | Organic | Organometallic

Hikari EBSD Camera Series

October 21, 2014 10:29 am | EDAX, Inc. | Products

EDAX’s high-speed and high-sensitivity Hikari EBSD Camera Series is the next generation in EBSD cameras offering outstanding performance across the complete range of EBSD applications. With Hikari cameras, users no longer need to decide between speed and sensitivity. Hikari cameras collect data at high speed when throughput is essential and perform at the same high indexing rates under challenging nano-analysis conditions. The Hikari EBSD Camera Series can achieve simultaneous acquisition and indexing speeds up to 1,400 indexed points per second for efficient SEM use.

LISTED UNDER: Elemental Analyzer | Diffraction, X-ray | Electron

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