The XEPOS from Spectro performs energy dispersive X-ray fluorescence (ED-XRF) analysis with polarized excitation using a twelve-position precision sample plate for samples between 32 and 40 mm in diameter. Featuring a Si-drift detector, the instrument can be placed in automatic analysis mode for safe, unattended operation and offers updated software with an intuitive method wizard that guides users step-by-step through method development. In addition, it is suited for RoHS compliance for the electrical and electronics industries, examination of ores and concentrates in the chemical and petrochemical industries, and analysis of coatings. By using additional secondary targets, the detection limits for certain elements can be lowered further, making the spectrometer suitable for a number of environmental applications.
Virtualization of the LabWith advanced computing and algorithmic technologies, modeling and simulation techniques are becoming more accepted and the results more reliable across a wide range of disciplines....continue
