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Systems Easily Merge AFM and Raman

July 9, 2010

Veeco's IRIS models for Innova and BioScope CatalystAtomic Force Microscopes provide integration and accessibility for combined atomic force microscopy and Raman spectroscopy research. The systems feature proprietary AFM performance and ease-of-use innovations that allow researchers to generate advanced AFM data simply and routinely, regardless of user skill level. The IRIS systems utilize scanning mechanisms and optical access that are tailored precisely to enable co-localized and high spatial resolution spectroscopy in life science or materials research.


"Researchers have relied on custom systems to combine AFM with spectroscopy, and there is a real need for commercial products that allow a greater percentage of spectroscopists to perform these complimentary techniques more easily and accurately," says Mark R. Munch, executive VP, Veeco Metrology & Instrumentation. "Our extensive AFM expertise and close collaboration with the leading inverted microscope and Raman spectrometer manufacturers have allowed us to develop seamlessly integrated AFM-Raman systems that can be tailored to specific application requirements, allowing researchers to concentrate on the data rather than the nuances of the technologies."

"ScanAsyst Imaging Mode and other recent Veeco innovations have revolutionized bio-AFM by making it dramatically easier for researchers of all experience levels to perform specialized experiments," adds David Rossi, VP and general manager of Veeco's AFM Business.

"With the Catalyst-IRIS and Innova-IRIS Systems, Veeco has taken the next step, leveraging technological advances to bring the full combined power of co-located AFM and Raman studies to targeted applications, including the characterization of photovoltaic devices, nanostructured materials, and biological samples. The ability to correlate the high quality data from Raman spectroscopy and the unique nanoscale mechanical properties provided by Veeco AFM will enable researchers to push into new frontiers of research."

Source: Veeco Instruments Inc.


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