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Silicon Magnetic Force Microscopy Probes

Silicon MFM (magnetic force microscopy) probes are suited for the visualization of magnetic domains. Based on the PointProbe Plus AFM probe, they are optimized for high sensitivity and enable tapping mode, non-contact and lift mode operation in air. They comply with the demands of a range of applications defined by various magnetic samples with different properties. Different magnetic coatings of the probes show long-term stability. Additionally, six different probes are offered. The standard probes feature a hard magnetic coating for high magnetic contrast and high lateral resolution. The low coercivity probes are coated with a soft magnetic thin film, enabling the measurement of magnetic domains within soft magnetic samples. Because of the low coercivity of the tip coating, the magnetization of the tip is reoriented by hard magnetic samples.
Nanosensors
Neuchatel