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EDS System Features Advanced Microanalysis Tools
The QUANTAX EDS system utilizes a high-resolution 125-eV XFlash detector and, with current ESPRIT software, employs new features and modules that can help users find elusive trace elements and make routine analysis easier. Silicon drift detectors (SDDs) offer optimal speed and resolution, providing researchers with a lot of data in a short amount of time. As a result, new analysis techniques have been developed to take advantage of this additional data. Maximum Pixel Spectrum, or MaxSpec, is useful when searching for trace constituents in an unknown specimen. Such small, localized concentrations may not be detected in the standard sum spectrum as the number of counts is usually too small. Utilizing a HyperMap data cube, the technique generates a spectrum that prominently shows the peaks of low concentration elements. This type of analysis requires large amounts of data but the XFlash SDD can gather this data in minutes.
Bruker AXS Inc.
5465 E. Cheryl Parkway
Madison, WI, 53711
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