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X-Ray Reflectometry Software Increases Automation

X’Pert Reflectivity 1.2 is a software tool for the analysis of X-ray reflectometry data, important in thin film production and processing research. The software can be launched and controlled using X’Pert APP (Auto-matic Processing Program), which increases the level of automation. Using a choice of three automatic fitting procedures, the program performs multiple simulations to refine selected sample and instrument parameters, ensuring the best fit with the measured data.
PANalytical
117 Flanders Road
Westborough, MA, 01581