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Benchtop Sulfur Analyzer Uses X-Ray Optics to Provide 0.4-ppm-wt LOD
Benchtop sulfur analyzer uses X-ray optics to provide 0.4-ppm-wt LOD
Booth 1608. The Sindie-7039 benchtop analyzer measures ultra low sulfur fuels using monochromatic wavelength-dispersive X-ray fluorescence (MWD XRF). This technique utilizes X-ray optics to provide analyzers with a limit of detection (LOD) at 0.4 ppm wt. Measuring 14.5 wide × 19.5 D × 13.5 high, the analyzer features a dynamic sample range of 0.4 to 3000 ppm wt, user-friendly software with a touch-screen interface, a flip-lid design for easy sample cup introduction and a measurement time of 30 to 300 sec. Additionally, it does not need a sample conversion or combustible gases.
Horiba Instruments Inc.
17671 Armstrong Avenue
Irvine, CA, 92614
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