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Benchtop X-Ray Spectrograph Performs Multi-Elemental Analysis
Booth 2520. The WDXRF Portaspec X Series benchtop model performs multi-elemental analysis in the range of Ti to U and is suited for measuring coating weights of both chrome and titanium pretreatments. An adjustable goniometer allows the user to analyze six elements, preset sequentially one at a time. Configured for analyzing liquids, powders, solids and thin films, the X-ray spectrograph features an easy load two-position sample holder. Samples are changed at the open end of the holder, allowing a sample to be analyzed while one is being loaded. The 2501XBT Portaspec comes complete with a built in computer and preinstalled software for computer controlled operation.
Cianflone Scientific Instruments Corp. 228 RIDC Park West Drive Pittsburgh, PA, 15275
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