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X-ray Diffractometer Employs Cross Beam Optics

The Ultima IV X-ray diffractometer is an advanced general purpose X-ray diffraction instrument for materials science, semiconductor and nanotechnology research and development, as well as quality assurance for the manufacturing environment. Features include a high speed detector for 100× faster measurements, application flexibility provided by Cross Beam Optics (CBO), and a 50% smaller size than a conventional XRD system. Fully optioned, the instrument can span applications that would have required up to four separate conventional XRD instruments in the past. A modular build-up platform allows users to add additional capabilities as new application requirements arise. The CBO mechanism allows users to switch between either a focusing or parallel incident X-ray beam without resetting or realigning the optical system. Both system geometries are permanently mounted and permanently aligned to allow easy changeover for different applications.
Rigaku
9009 New Trails Dr.
The Woodlands, TX, 77381