The NeoScope benchtop SEM is a result of Nikon Instruments’ and JEOL’s respective experience in optical and electron microscopy. Electron microscopy is closely related to optical microscopy, but this SEM extends the depth of field and resolution beyond the optical microscope. The instrument, targeted at the bioscience research and industrial inspection communities, fills the optical microscopist’s need for advanced imaging capability that is both affordable and easy to use. Offering high magnification without loss of depth of focus, the SEM can help accelerate the pace of research in the life sciences, forensics and failure analysis of manufacturing materials. Also, it images both conductive and non-conductive samples without special preparation. Other features include operation in both low and high vacuum modes and three settings for accelerating voltage suitable for various applications.